| 摘要 |
A specimen slide (100) having a sample region (101) in which a sample (200) that can be investigated microscopically can be arranged, and that comprises reference points (A-Z, 1-24, a-j, alpha-kappa) arranged at least in the sample region (101), is proposed. The reference points (A-Z, 1-24, a-j, alpha-kappa) are embodied in such a way that on the basis of an identification of at least a stipulated number of reference points (A-Z, 1-24, a-j, alpha-kappa) in an arbitrary sub-region (102) of the sample region (101), the position of the arbitrary sub-region (102), and/or at least one position therein, on the specimen slide (100) can be unequivocally determined A method for determining and/or retrieving a position on a corresponding specimen slide, and a corresponding sample investigation system, are likewise subjects of the invention. |
