发明名称 SILICON CARBIDE SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING SAME
摘要 <p>A gate electrode (50) includes a polysilicon film (51) in contact with a gate insulating film (41), a barrier film (52) provided on the polysilicon film (51), a metal film (53) provided on the barrier film (52) and made of refractory metal. An interlayer insulating film (42) is arranged so as to cover the gate insulating film (41) and the gate electrode (50) provided on the gate insulating film (41). The interlayer insulating film (42) has a substrate contact hole (SH) partially exposing a silicon carbide substrate (30) in a region in contact with the gate insulating film (41). A interconnection (71) is electrically connected to the silicon carbide substrate (30) through the substrate contact hole (SH) and is electrically insulated from the gate electrode (50) by the interlayer insulating film (42).</p>
申请公布号 KR20140021609(A) 申请公布日期 2014.02.20
申请号 KR20137027717 申请日期 2012.05.29
申请人 SUMITOMO ELECTRIC INDUSTRIES, LTD. 发明人 HONAGA MISAKO;MASUDA TAKEYOSHI
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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