发明名称 Active area bonding compatible high current structures
摘要 A semiconductor structure comprises a top metal layer, a bond pad formed on the top metal layer, a conductor formed below the top metal layer, and an insulation layer separating the conductor from the top metal layer. The top metal layer includes a sub-layer of relatively stiff material compared to the remaining portion of the top metal layer. The sub-layer of relatively stiff material is configured to distribute stresses over the insulation layer to reduce cracking in the insulation layer.
申请公布号 US8652960(B2) 申请公布日期 2014.02.18
申请号 US201213717942 申请日期 2012.12.18
申请人 INTERSIL AMERICAS INC. 发明人 GASNER JOHN T.;CHURCH MICHAEL D.;PARAB SAMEER D.;BAKEMAN, JR. PAUL E.;DECROSTA DAVID A.;LOMENICK ROBERT;MCCARTY CHRIS A.
分类号 H01L21/44 主分类号 H01L21/44
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