发明名称 III-NITRIDE ENHANCEMENT MODE TRANSISTORS WITH TUNABLE AND HIGH GATE-SOURCE VOLTAGE RATING
摘要 <p>A semiconductor device includes an enhancement mode GaN FET (102) with a depletion mode GaN FET (104) electrically coupled in series between a gate node (120) of the enhancement mode GaN FET and a gate terminal (116) of the semiconductor device. A gate node (122) of the depletion mode GaN FET is electrically coupled to a source node (106) of the enhancement mode GaN FET and to a source terminal (108) of the semiconductor device, a drain node (110) of the enhancement mode GaN FET is electrically coupled to a drain terminal (112) of the semiconductor device, and a drain node (114) of the depletion mode GaN FET is electrically coupled to the gate terminal (116) of the semiconductor device.</p>
申请公布号 WO2014026018(A1) 申请公布日期 2014.02.13
申请号 WO2013US54168 申请日期 2013.08.08
申请人 TEXAS INSTRUMENTS INCORPORATED;TEXAS INSTRUMENTS JAPAN LIMITED 发明人 PENDHARKAR, SAMEER;TIPIRNENI, NAVEEN
分类号 H01L29/78;H01L21/336 主分类号 H01L29/78
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