发明名称 |
III-NITRIDE ENHANCEMENT MODE TRANSISTORS WITH TUNABLE AND HIGH GATE-SOURCE VOLTAGE RATING |
摘要 |
<p>A semiconductor device includes an enhancement mode GaN FET (102) with a depletion mode GaN FET (104) electrically coupled in series between a gate node (120) of the enhancement mode GaN FET and a gate terminal (116) of the semiconductor device. A gate node (122) of the depletion mode GaN FET is electrically coupled to a source node (106) of the enhancement mode GaN FET and to a source terminal (108) of the semiconductor device, a drain node (110) of the enhancement mode GaN FET is electrically coupled to a drain terminal (112) of the semiconductor device, and a drain node (114) of the depletion mode GaN FET is electrically coupled to the gate terminal (116) of the semiconductor device.</p> |
申请公布号 |
WO2014026018(A1) |
申请公布日期 |
2014.02.13 |
申请号 |
WO2013US54168 |
申请日期 |
2013.08.08 |
申请人 |
TEXAS INSTRUMENTS INCORPORATED;TEXAS INSTRUMENTS JAPAN LIMITED |
发明人 |
PENDHARKAR, SAMEER;TIPIRNENI, NAVEEN |
分类号 |
H01L29/78;H01L21/336 |
主分类号 |
H01L29/78 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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