Method for preparing target structure to be tested in sample, involves imaging target structure in focus of microscope optics, which has z-axis, where sample transverse to z-axis is cut in sample area above or below target structure

摘要

The method involves imaging a target structure (2) in a focus of a microscope optics, which has a z-axis. The sample transverse to the z-axis is cut in a sample area above or below the target structure for producing a first reference surface (F1) with a cutter. The first reference surface is displayed in the focus of the microscope optics by refocusing the target structure to the first reference surface, and determines the necessary relative movement between the sample and the microscope optics in the z-direction as an optical path length (z1). An independent claim is included for a device for preparing a target structure to be tested in a sample.