发明名称 SYSTEMS AND METHODS FOR WEIGH SCALE PERIMETER MONITORING FOR SCANNER-SCALES
摘要 Systems and methods for reducing erroneous weighing of items such as by detecting items extending beyond a periphery of a weigh platter whereby in one configuration, the system employs a light guide for routing a light beam to a detector operative to detect interruption of the beam due to an item encroaching upon or overhanging an edge of the platter. In another configuration, the scale includes a perimeter gap between the platter outer edge and scanner housing frame or checkout counter, a light beam directed angularly upward through the gap is partially obstructed by the frame and platter whereby light exits the gap forming a light plane, wherein an object placed on the platter extending across the gap intersects the light plane thus scattering light rays, some of which are sensed by a detector. Various indicators for alerting the operator of off-scale detection are also described.
申请公布号 US2014041950(A1) 申请公布日期 2014.02.13
申请号 US201314057938 申请日期 2013.10.18
申请人 DATALOGIC ADC, INC. 发明人 MCQUEEN ALEXANDER M.;O'DONNELL PATRICK M.
分类号 G01G23/18;G01G19/00;G01G19/52 主分类号 G01G23/18
代理机构 代理人
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