发明名称 METHOD OF MAKING STRUCTURE HAVING A GATE STACK
摘要 A method includes removing a first portion of a gate layer of a structure. The structure includes a drain region, a source region, and a gate stack, and the gate stack includes a gate dielectric layer, a gate conductive layer directly on the gate dielectric layer, and the gate layer directly on the gate conductive layer. A drain contact region is formed on the drain region, and a source contact region is formed on the source region. A conductive region is formed directly on the gate conductive layer and adjacent to a second portion of the gate layer. A gate contact terminal is formed in contact with the conductive region.
申请公布号 US2014045310(A1) 申请公布日期 2014.02.13
申请号 US201314058523 申请日期 2013.10.21
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 CHUANG HARRY-HAK-LAY;SONG MING-HSIANG;CHEN KUO-JI;ZHU MING;CHEN PO-NIEN;YOUNG BAO-RU
分类号 H01L21/28;H01L21/283;H01L21/48 主分类号 H01L21/28
代理机构 代理人
主权项
地址