发明名称 |
Semiconductor device and method of testing semiconductor device |
摘要 |
According to the following disclosure, disclosed is a semiconductor device including: an internal circuit configured to receive and output a signal current; a current mirror unit outputting a copied current corresponding to the signal current; and a test pad from which the copied current is taken out. |
申请公布号 |
US8648617(B2) |
申请公布日期 |
2014.02.11 |
申请号 |
US201113022174 |
申请日期 |
2011.02.07 |
申请人 |
MARUYAMA YUJI;MIZUMASA TATSUHIRO;NAKASHIRO TAKAYUKI;GOTOH SHIGERU;YANO TAKAYUKI;KOSHINUMA SUSUMU;TANIGUCHI SHUNSUKE;YANAGISAKO YUKI;FUJITSU SEMICONDUCTOR LIMITED |
发明人 |
MARUYAMA YUJI;MIZUMASA TATSUHIRO;NAKASHIRO TAKAYUKI;GOTOH SHIGERU;YANO TAKAYUKI;KOSHINUMA SUSUMU;TANIGUCHI SHUNSUKE;YANAGISAKO YUKI |
分类号 |
G01R31/26 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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