发明名称 INSULATION TESTER OF PRINTED CIRCUIT BOARD AND INSULATION TEST METHOD
摘要 An insulation testing device applies a direct current between circuit patterns (C1 to C4) of a print substrate and determines the failure of insulation state of the print substrate based on an applied voltage value and a resistance value between the circuit patterns. The resistance value is calculated from a current value flowing in the circuit patterns. The insulation testing device comprises; a current detection unit (7) which detects a current flowing in the circuit patterns by the application of a voltage; a current increasing detection unit (9) which detects whether a current value detected by the current detection unit (7) is increased over a predetermined value based on a spark generated between the circuit patterns within a spark detection time from voltage application start to voltage increasing completion; a spark determination unit (25) which determines a print substrate as a defective product if the current increase is detected by the current increasing detection unit; and a spark detection time setting unit (10) which can change prescribed hours. [Reference numerals] (10) Spark detection time setting unit; (12) Display device; (21) Memory; (23) Data communication unit; (25) Spark determination unit; (26) Insulation state determination unit; (3) Switch conversion control unit; (5) Applied voltage control unit; (6) Voltage detection unit; (7) Current detection unit; (8) Voltage increase completion detection unit; (9) Current increase detection unit
申请公布号 KR20140016828(A) 申请公布日期 2014.02.10
申请号 KR20130088556 申请日期 2013.07.26
申请人 YAMAHA FINE TECHNOLOGIES CO., LTD. 发明人 TSUCHIDA KENGO;MIYAKE YASUSHI
分类号 G01R31/12;G01R27/08;G01R31/02;G01R31/28 主分类号 G01R31/12
代理机构 代理人
主权项
地址