发明名称 SYSTEM ON CHIP AND TEMPERATURE CONTROL METHOD THEREOF
摘要 According to the present invention, a method for controlling the temperature of a semiconductor device includes a step of sensing the driving temperature of the semiconductor device, a step of controlling a body bias level for at least one functional block of the semiconductor device if the driving temperature satisfies a first condition, and a step of activating a thermal throttling operation and controlling the body bias level at the same time if the driving temperature satisfies a second condition. The thermal throttling operation controls the driving voltage and/or clock frequency of the at least one functional block of the semiconductor device.
申请公布号 KR20140015880(A) 申请公布日期 2014.02.07
申请号 KR20120081855 申请日期 2012.07.26
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM, HYUNG OCK;KIM, WOOK;SEO, MUN JUN;OH, CHUNG KI;JEON, JAE HAN;DO, KYUNG TAE;CHOI, JUNG YUN;WON, HYO SIG;KIM KEESUP
分类号 G05F1/567 主分类号 G05F1/567
代理机构 代理人
主权项
地址