| 摘要 |
PROBLEM TO BE SOLVED: To provide a system and a method of magnetic induction tomography to examine electromagnetic properties of an object.SOLUTION: A magnetic induction tomography system (1) to examine electromagnetic properties of an object (2) for providing a high-resolution MIT technique without increasing the number of coils comprises: one or a plurality of generator coils (4) applied so as to generate a primary magnetic field for inducing an eddy current in the object (2); one or a plurality of sensor coils (5) applied so as to detect a secondary magnetic field generated as a result of the eddy current; and means 6, 7, 8 and 9 for giving relative movements between one or a plurality of the generator coils (4) and/or one or a plurality of the sensor coils (5), and the object (2) to be examined. |
