发明名称 APPARATUS AND METHOD FOR CALCULATING A WAFER POSITION IN A PROCESSING CHAMBER UNDER PROCESS CONDITIONS
摘要 An apparatus for processing a wafer including a reaction chamber having a reaction space for processing the wafer, a susceptor positioned within the reaction chamber and having a sidewall, at least one light source positioned outside of the reaction space, at least one window in the reaction chamber, and wherein the at least one light source is directed through the at least one window to contact the sidewall.
申请公布号 US2014036274(A1) 申请公布日期 2014.02.06
申请号 US201213563066 申请日期 2012.07.31
申请人 MARQUARDT DAVID;SHUGRUE JOHN;ASM IP HOLDING B.V. 发明人 MARQUARDT DAVID;SHUGRUE JOHN
分类号 F27D11/00;G01B11/14 主分类号 F27D11/00
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