| 摘要 |
PROBLEM TO BE SOLVED: To improve statistical reliability of a reference model and early know a symptom of abnormality in a device to be diagnosed.SOLUTION: The device state diagnostic apparatus generates a reference model (an industry model (a change characteristic I)) on the basis of actual operation data collected from multiple devices that are of the same type as a specified device to be diagnosed and are used in the same industry. The apparatus generates a diagnostic object model (a change characteristic V) on the basis of the actual operation data collected from the specified device to be diagnosed. The apparatus compares the diagnostic object model (the change characteristic V) with an acceptable range model (change characteristics II and III) to the industry model (the change characteristic I), and diagnoses a state of the device to be diagnosed, on the basis of a result of the comparison. Specifically, the apparatus obtains a model coefficient AX1 of the diagnostic object model, compares it with an acceptable range ±α to a coefficient AG1 in a model formula for the industry model G1, and determines that the device to be diagnosed is in a special state when the AX1 is outside the acceptable range ±α. |
