发明名称 |
WIGGLE CHARACTERISTIC INSPECTION METHOD |
摘要 |
PROBLEM TO BE SOLVED: To easily inspect wiggle characteristics with high reproducibility between an optical transceiver and an optical fiber to be connected to the optical transceiver.SOLUTION: A wiggle characteristic inspection method aiming to inspect wiggle characteristics of an optical transceiver 1 is carried out by using an annular inspection tool (ring member ) 8 that is disposed at a predetermined distance from an end of a substrate 6 mounting the optical transceiver 1, in a direction orthogonal to the substrate 6 and parallel to the substrate edge. The method includes the steps of: setting the optical transceiver 1 on the substrate 6 so as to align an optical fiber lead-out point of the optical transceiver 1 to the center of the ring member 8; operating a semiconductor optical element mounted in the optical transceiver 1; and moving an optical fiber 11 which is led out from the optical transceiver 1 and in an inclined state with respect to the optical axis of the optical transceiver 1, along a ring inner circumference surface of the ring member 8 to inspect wiggle characteristics of the optical transceiver 1. |
申请公布号 |
JP2014021175(A) |
申请公布日期 |
2014.02.03 |
申请号 |
JP20120157211 |
申请日期 |
2012.07.13 |
申请人 |
SUMITOMO ELECTRIC DEVICE INNOVATIONS INC |
发明人 |
TAKAHASHI KATSUYUKI;SATO SUSUMU;KOYANAGI TAKASHI |
分类号 |
G02B6/42 |
主分类号 |
G02B6/42 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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