发明名称 WIGGLE CHARACTERISTIC INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To easily inspect wiggle characteristics with high reproducibility between an optical transceiver and an optical fiber to be connected to the optical transceiver.SOLUTION: A wiggle characteristic inspection method aiming to inspect wiggle characteristics of an optical transceiver 1 is carried out by using an annular inspection tool (ring member ) 8 that is disposed at a predetermined distance from an end of a substrate 6 mounting the optical transceiver 1, in a direction orthogonal to the substrate 6 and parallel to the substrate edge. The method includes the steps of: setting the optical transceiver 1 on the substrate 6 so as to align an optical fiber lead-out point of the optical transceiver 1 to the center of the ring member 8; operating a semiconductor optical element mounted in the optical transceiver 1; and moving an optical fiber 11 which is led out from the optical transceiver 1 and in an inclined state with respect to the optical axis of the optical transceiver 1, along a ring inner circumference surface of the ring member 8 to inspect wiggle characteristics of the optical transceiver 1.
申请公布号 JP2014021175(A) 申请公布日期 2014.02.03
申请号 JP20120157211 申请日期 2012.07.13
申请人 SUMITOMO ELECTRIC DEVICE INNOVATIONS INC 发明人 TAKAHASHI KATSUYUKI;SATO SUSUMU;KOYANAGI TAKASHI
分类号 G02B6/42 主分类号 G02B6/42
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