| 摘要 |
PROBLEM TO BE SOLVED: To reduce the costs of a test posterior to program correction by using test resources prior to program correction.SOLUTION: A test data generation device acquires first test data to be used for the test of a pre-correction program and path condition information showing path conditions expressing an execution path shown by the combination of processing paths to be branched and made to pass under conditions included in the source code of a post-correction program by a logical formula, and stores the acquired first test data in a test data storage section, and stores the acquired path condition information in a path condition storage section, and extracts the path condition information which is not logically the same value as the first test data stored in the test data storage section from the path condition information stored in the path condition storage section, and generates second test data satisfying the path conditions shown by the extracted path condition information. |
