| 摘要 |
PROBLEM TO BE SOLVED: To provide an X-ray apparatus and an X-ray measurement method that can increase sensitivity to a positional shift of an X-ray flux as compared with known art.SOLUTION: An X-ray apparatus includes detector means having pixels configured to detect an intensity of the X-ray flux which has been split by a splitting element and has passed through an object to be detected. The X-ray apparatus also includes an absorbing element arranged between two pixels of the detector means and configured to absorb part of the X-ray flux. |
