发明名称 SCANNING PROBE MICROSCOPE
摘要 A probe microscope head (10) of a scanning probe microscope is provided with: a scanning mechanism (11) which scans a cantilever chip (1) along an X-axis, a Y-axis, and a Z-axis that are orthogonal to each other; and an optical transmission plate (20) which is disposed in contact with liquid. The optical transmission plate (20) causes detection light for detecting the displacement of a cantilever of the cantilever chip (1) to transmit therethrough, and is not scanned by the scanning mechanism (11).
申请公布号 WO2014017326(A1) 申请公布日期 2014.01.30
申请号 WO2013JP69199 申请日期 2013.07.12
申请人 OLYMPUS CORPORATION 发明人 SAKAI, NOBUAKI;UEKUSA, YOSHITSUGU
分类号 G01Q30/14 主分类号 G01Q30/14
代理机构 代理人
主权项
地址