| 摘要 |
The invention relates to the sphere of atomic absorption spectrophotometry and is suitable for use in atomic absorption analysis and spectral instrument engineering. The object of the invention is to improve the accuracy of measurements under the conditions of non-selective absorption. The objective is solved by means of that in the method for atomic absorption measurements the emission from the sources of a continuous or discontinuous spectrum is alternatively passed through the work sample atomic vapor for the measurement of the atomic vapor optical density. Furthermore, samples with different concentrations of material providing the origination of non-selective absorption are previously put into the atomizer, and the optical density of non-selective absorption Dof each of the samples is determined from the expressionwhere Jis the emission intensity of the continuous spectrum source before the atomizer; Jis the emission intensity of the continuous spectrum source after the atomizer, and uncompensated value of the optical density of the non-selective absorption Dof each of the samples is determined from the expressionwhere Jis the emission intensity of the continuous spectrum source after the atomizer; Jis the emission intensity of the discontinuous spectrum source after the atomizer, measurements are repeated to obtain the dependence D=F(D), Dof the work sample, and in accordance with said dependence - Dof the work sample are determined, the value of which is used for the correction of the result of measurement of the optical density of the work sample atomic vapor. |
