发明名称 Method of fabricating semiconductor device
摘要 A method of forming a dielectric layer having an air gap to isolate adjacent wirings or a gate stack of the semiconductor device is provided. A method of fabricating a semiconductor device includes providing a semiconductor substrate on which a plurality of wirings are formed adjacent to one another and forming a dielectric layer filling an upper portion of a space between the adjacent wirings to form air gaps by a thermal chemical vapor deposition method.
申请公布号 KR101356695(B1) 申请公布日期 2014.01.29
申请号 KR20070078706 申请日期 2007.08.06
申请人 发明人
分类号 H01L21/31 主分类号 H01L21/31
代理机构 代理人
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