发明名称 Nonvolatile memory cell without a dielectric antifuse having high- and low-impedance states
摘要 A memory cell according to the present invention comprises a bottom conductor, a doped semiconductor pillar, and a top conductor. The memory cell does not include a dielectric rupture antifuse separating the doped semiconductor pillar from either conductor, or within the semiconductor pillar. The memory cell is formed in a high-impedance state, in which little or no current flows between the conductors on application of a read voltage. Application of a programming voltage programs the cell, converting the memory cell from its initial high-impedance state to a low-impedance state. A monolithic three dimensional memory array of such cells can be formed, comprising multiple memory levels, the levels monolithically formed above one another.
申请公布号 US8637366(B2) 申请公布日期 2014.01.28
申请号 US20040955549 申请日期 2004.09.29
申请人 HERNER S. BRAD;WALKER ANDREW J.;SANDISK 3D LLC 发明人 HERNER S. BRAD;WALKER ANDREW J.
分类号 H01L29/80;G11C7/00;G11C11/39;G11C17/06;G11C17/16;G11C29/00;H01L21/336;H01L21/82;H01L27/24;H01L29/73;H01L45/00 主分类号 H01L29/80
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