发明名称 CALIBRATION METHOD OF INTERFERENCE SHAPE MEASUREMENT MECHANISM
摘要 PROBLEM TO BE SOLVED: To provide a novel calibration method of an interference shape measurement machine not using a three-surface aligning method, capable of highly accurately measuring a straight shape by the interference shape measurement machine and measuring a surface shape by using the result.SOLUTION: A systematic error of an interference shape measurement mechanism and an unknown shape error of a measured object are separated in two directions to obtain two straight shape data. Such calibrated straight shape data groups are associated with each other to constitute a surface, and calibration as a surface is completed.
申请公布号 JP2014013226(A) 申请公布日期 2014.01.23
申请号 JP20120187134 申请日期 2012.08.28
申请人 KIYONO SATOSHI 发明人 KIYONO SATOSHI
分类号 G01B11/24;G01B9/02 主分类号 G01B11/24
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