Ocular surface interferometry (OSI) devices, systems, and methods for imaging, processing, and/or displaying an ocular tear film and/or measuring ocular tear film layer thickness (ES)

摘要

OCULAR SURFACE INTERFEROMETRY (OSI) DEVICES, SYSTEMS, AND METHODS FOR IMAGING, PROCESSING, AND/OR DISPLAYING AN OCULAR TEAR FILM AND/OR MEASURING OCULAR TEAR FILM LAYER THICKNESS(ES) Ocular surface interferometry (OSI) devices 30, systems, and methods are disclosed for measuring a tear film layer thickness (TFLT) of the ocular tear film 46, including lipid layer 1o thickness (LLT) and/or aqueous layer thickness (ALT). The measured TFLT can be used to diagnosis dry eye syndrome (DES). In certain disclosed embodiments, a multi-wavelength light source 36 can be controlled to illuminate the ocular tear film 46. Light emitted from the multi-wavelength light source 36 undergoes optical wave interference interactions in the tear film 46. An imaging device 40 can be focused on the lipid layer 50 of the tear film 46 to is capture optical wave interference interactions of specularly reflected light from the tear film 46 combined with a background signal(s) in a first image 79. The imaging device 40 can also be focused on the lipid layer 50 of the tear film 46 to capture a second image 90 containing the background signal(s) present in the first image 79.