INSTRUMENTATION APPARATUS OF A STRUCTURE AND INSTRUMENTATION METHOD OF A STRUCTURE
摘要
The present invention relates to an instrumentation apparatus of a structure and an instrumentation method of a structure. The disclosed instrumentation apparatus comprises: a measuring instrument for measuring position data on common points; a visual data creating unit for creating visual metrological data on the common points; and an integrated metrological data creating unit for creating integrated metrological data by calibrating the visual metrological data. [Reference numerals] (110) Three dimensional measuring instrument; (120) Visual data creating unit; (121) Image photographing device; (122) Image processing unit; (130) Integrated metrological data creating unit; (131) Matching unit; (132) Data analysis unit; (140) User interface unit; (150) Image photographing device driving unit; (160) Display unit
申请公布号
KR20140009769(A)
申请公布日期
2014.01.23
申请号
KR20120076459
申请日期
2012.07.13
申请人
SAMSUNG HEAVY IND. CO., LTD.
发明人
KIM, SUNG HAN;YOON, JI WON;CHOI, DOO JIN;HA, YUN SOK