发明名称 INSTRUMENTATION APPARATUS OF A STRUCTURE AND INSTRUMENTATION METHOD OF A STRUCTURE
摘要 The present invention relates to an instrumentation apparatus of a structure and an instrumentation method of a structure. The disclosed instrumentation apparatus comprises: a measuring instrument for measuring position data on common points; a visual data creating unit for creating visual metrological data on the common points; and an integrated metrological data creating unit for creating integrated metrological data by calibrating the visual metrological data. [Reference numerals] (110) Three dimensional measuring instrument; (120) Visual data creating unit; (121) Image photographing device; (122) Image processing unit; (130) Integrated metrological data creating unit; (131) Matching unit; (132) Data analysis unit; (140) User interface unit; (150) Image photographing device driving unit; (160) Display unit
申请公布号 KR20140009769(A) 申请公布日期 2014.01.23
申请号 KR20120076459 申请日期 2012.07.13
申请人 SAMSUNG HEAVY IND. CO., LTD. 发明人 KIM, SUNG HAN;YOON, JI WON;CHOI, DOO JIN;HA, YUN SOK
分类号 G01B11/02;G01C11/36 主分类号 G01B11/02
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