发明名称 PHOTOMETRIC ANALYSIS DEVICE AND PHOTOMETRIC ANALYSIS METHOD USING WAVELENGTH CHARACTERISTIC OF LIGHT EMITTED FROM SINGLE ILLUMINANT PARTICLE
摘要 <p>The inventive technique of detecting and analyzing light from a light-emitting particle in accordance with the scanning molecule counting method using an optical measurement with a confocal microscope or a multiphoton microscope is characterized by detecting intensities of components of two or more wavelength bands of light from a light detection region of an optical system with moving the position of the light detection region in a sample solution by changing the optical path of the optical system of the microscope; detecting individually signals of the light from each light-emitting particle in the intensities of the components of the two or more wavelength bands of the detected light; and identifying a kind of light-emitting particle based on the intensities of the components of the two or more wavelength bands of the signals of the light of the detected light-emitting particle.</p>
申请公布号 EP2631631(A4) 申请公布日期 2014.01.22
申请号 EP20110843762 申请日期 2011.11.14
申请人 OLYMPUS CORPORATION 发明人 HANASHI, TAKUYA;TANABE, TETSUYA;YAMAGUCHI, MITSUSHIRO
分类号 G01N21/64;G02B21/00 主分类号 G01N21/64
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