发明名称 |
PHOTOMETRIC ANALYSIS DEVICE AND PHOTOMETRIC ANALYSIS METHOD USING WAVELENGTH CHARACTERISTIC OF LIGHT EMITTED FROM SINGLE ILLUMINANT PARTICLE |
摘要 |
<p>The inventive technique of detecting and analyzing light from a light-emitting particle in accordance with the scanning molecule counting method using an optical measurement with a confocal microscope or a multiphoton microscope is characterized by detecting intensities of components of two or more wavelength bands of light from a light detection region of an optical system with moving the position of the light detection region in a sample solution by changing the optical path of the optical system of the microscope; detecting individually signals of the light from each light-emitting particle in the intensities of the components of the two or more wavelength bands of the detected light; and identifying a kind of light-emitting particle based on the intensities of the components of the two or more wavelength bands of the signals of the light of the detected light-emitting particle.</p> |
申请公布号 |
EP2631631(A4) |
申请公布日期 |
2014.01.22 |
申请号 |
EP20110843762 |
申请日期 |
2011.11.14 |
申请人 |
OLYMPUS CORPORATION |
发明人 |
HANASHI, TAKUYA;TANABE, TETSUYA;YAMAGUCHI, MITSUSHIRO |
分类号 |
G01N21/64;G02B21/00 |
主分类号 |
G01N21/64 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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