发明名称 Depositing titanium silicon nitride films for forming phase change memories
摘要 Organometallic precursors may be utilized to form titanium silicon nitride films that act as heaters for phase change memories. By using a combination of TDMAT and TrDMASi, for example in a metal organic chemical vapor deposition chamber, a relatively high percentage of silicon may be achieved in reasonable deposition times, in some embodiments. In one embodiment, two separate bubblers may be utilized to feed the two organometallic compounds in gaseous form to the deposition chamber so that the relative proportions of the precursors can be readily controlled.
申请公布号 US8633463(B2) 申请公布日期 2014.01.21
申请号 US201313945241 申请日期 2013.07.18
申请人 MICRON TECHNOLOGY, INC. 发明人 LEE JONG-WON;CHANG KUO-WEI;MCSWINEY MICHAEL L.
分类号 H01L29/02;H01L47/00 主分类号 H01L29/02
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