发明名称 Wafer with design printed outside active region and spaced by design tolerance of reticle blind
摘要 A printed wafer. A design is printed within a peripheral portion of the wafer. The peripheral portion of the wafer is between an outer boundary of an active portion of the wafer and an outer boundary of the wafer. The design may be a copy of a portion of a pattern that exists on a reticle of an exposure apparatus. The pattern may includes pattern elements such that adjacent pattern elements are separated by a spacing of about a sum of a first design tolerance (based on how accurately a reticle blind can be positioned within the exposure apparatus) and a second design tolerance (based on how sharply an edge of the reticle blind can be focused on the wafer by a lens). The design may visible to a naked eye unaided with no portion of the printed design within the active portion of the wafer.
申请公布号 US8634063(B2) 申请公布日期 2014.01.21
申请号 US20090637048 申请日期 2009.12.14
申请人 FROEBEL ROBERT T.;PEALER, III GRANT N.;SONNTAG PAUL D.;INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 FROEBEL ROBERT T.;PEALER, III GRANT N.;SONNTAG PAUL D.
分类号 G03B27/72;G03F7/20;H01L23/544 主分类号 G03B27/72
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