发明名称 Apparatus for measuring fluorescence decay characteristics of materials
摘要 PCT No. PCT/GB85/00028 Sec. 371 Date Sep. 18, 1985 Sec. 102(e) Date Sep. 18, 1985 PCT Filed Jan. 21, 1985 PCT Pub. No. WO85/03352 PCT Pub. Date Aug. 1, 1985.The invention provides an apparatus for measuring fluorescence characteristics of a sample material located at a sample station (3) comprising a fluorescence photon-event receiving means (9), an excitation light source (1) and a means (13, 14, 16) for determining the pulse profile of the excitation light. Detecting means (10) is coupled to receive the output of receiving means (9) and the output of the determining means (13, 14, 16) and synchronization means (4, 6, 7) is operable by the excitation light source to generate synchronization pulses for controlling operation of a measuring means (8, 12) which is coupled to the detecting means (10) and which is operable according to the photon correlation technique to provide on a time-shared basis a measure of the fluorescence characteristics and a measurement of the pulse profile.
申请公布号 US4686371(A) 申请公布日期 1987.08.11
申请号 US19850778451 申请日期 1985.09.18
申请人 发明人
分类号 G01N21/64;(IPC1-7):G01N21/64 主分类号 G01N21/64
代理机构 代理人
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