发明名称 FINE PATTERN FORMING METHOD, AND DEVELOPING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a method for forming a satisfactory fine pattern which improves etching resistance, and to provide a developing fluid.SOLUTION: A fine pattern forming method includes: a phase separation step of forming a layer including a block copolymer in which a plurality of kinds of blocks are bonded, on a substrate, and then heating the layer for phase separation of the layer; a decomposition step of decomposing at least a portion of a phase comprised of at least one kind of blocks among the plurality of kinds of blocks constituting the block copolymer; a selective removal step of immersing the layer in a developing fluid, and selectively removing a phase including the decomposed block to form a nano structure; and an etching step of etching the substrate by using the nano structure as a mask. The developing fluid contains, as a main component, organic solvent whose vapor pressure at 25°C is less than 2.1 kPa and whose SP value (Solubility Parameter) is 7.5 to 11.5 (cal/cm), or benzene which may be replaced by alkyl group, alkoxy group or halogen atom, and further contains metal alkoxide.
申请公布号 JP2014011245(A) 申请公布日期 2014.01.20
申请号 JP20120145474 申请日期 2012.06.28
申请人 INSTITUTE OF PHYSICAL & CHEMICAL RESEARCH;TOKYO OHKA KOGYO CO LTD 发明人 FUJIKAWA SHIGENORI;HAYAKAWA HARUMI;SENZAKI TAKAHIRO;MIYAGI MASARU
分类号 H01L21/027;B29C33/38;B82Y40/00;H01L21/3065 主分类号 H01L21/027
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