发明名称 SEMICONDUCTOR COMPONENT HAVING THROUGH-SILICON VIAS AND METHOD OF MANUFACTURE
摘要 A semiconductor component includes a semiconductor substrate having an opening A first dielectric liner having a first compressive stress is disposed in the opening. A second dielectric liner having a tensile stress is disposed on the first dielectric liner. A third dielectric liner having a second compressive stress disposed on the second dielectric liner.
申请公布号 US2014015146(A1) 申请公布日期 2014.01.16
申请号 US201314033862 申请日期 2013.09.23
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 YU CHEN-HUA;CHANG CHENG-HUNG;LIAO EBIN;YU CHIA-LIN;WANG HSIANG-YI;CHANG CHUN HUA;HUANG LI-HSIEN;KUO DARRYL;WU TSANG-JIUH;CHIOU WEN-CHIH
分类号 H01L23/498 主分类号 H01L23/498
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