发明名称 DAMPED EGT PROBE
摘要 A temperature probe includes a flange, a support structure, thermocouple wires, and guide plates. The flange has a midline. The support structure is attached to the midline and extends away from the flange. The thermocouple wires extend along the support structure, and terminate in a set of outer sensing tips and a set of inner sensing tips. The guide plates secure the thermocouple wires to the support structure. The guide plates are offset laterally from the midline of the flange.
申请公布号 US2014016670(A1) 申请公布日期 2014.01.16
申请号 US201213550174 申请日期 2012.07.16
申请人 GREENBERG MICHAEL D.;SPENCE RYAN;KELLY WILLIAM T.;DELORME JOSEPH;MCLARTY BOBBY J.;UNITED TECHNOLOGIES CORPORATION 发明人 GREENBERG MICHAEL D.;SPENCE RYAN;KELLY WILLIAM T.;DELORME JOSEPH;MCLARTY BOBBY J.
分类号 G01K7/02;B23P17/00 主分类号 G01K7/02
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