| 摘要 |
A circuit configured to sample a signal of a source circuit and to provide calibration signals to a testing device of the signal sampled from the source circuit. The circuit may include an amplifier, a sampling circuit, and a calibration circuit. The amplifier may be configured to drive signals on an internal node to the testing device. The sampling circuit may be configured to provide a sample of a signal from the source circuit to the internal node. The calibration circuit may be configured to provide a first calibration signal and a second calibration signal to the internal node. The second calibration signal may be a known proportion of the first calibration signal. |
