发明名称 POSITIVE RESIST MATERIAL AND PATTERN FORMING METHOD
摘要 PROBLEM TO BE SOLVED: To provide a positive resist material having appropriate absorption for forming a pattern on a high reflective substrate, showing a good pattern profile and adhesiveness after exposure and good filling characteristics in a stepped substrate, and having ion implantation durability upon carrying out ion implantation, and to provide a pattern forming method.SOLUTION: The positive resist material comprises: a polymeric compound having a weight average molecular weight ranging from 1,000 to 500,000 and containing a repeating unit having a structure in which a hydrogen atom of a carboxyl group is substituted with an acid-labile group having a cyclic structure; at least one novolac resin selected from substituted or unsubstituted phenolphthalein, phenol red, cresol phthalein, cresol red and thymolphthalein; and a photoacid generator.
申请公布号 JP2014006403(A) 申请公布日期 2014.01.16
申请号 JP20120142479 申请日期 2012.06.25
申请人 SHIN ETSU CHEM CO LTD 发明人 HATAKEYAMA JUN
分类号 G03F7/039;G03F7/004;H01L21/027 主分类号 G03F7/039
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