发明名称 Aberration correction system
摘要 <p>An aberration correction system is offered which is for use in an electronmicroscope and which produces a negative spherical aberration and corrects a higher-order aberration. The aberration correction system has threestagesof multipole elements (21, 22, 23) which respectively produce fields of 3-fold symmetry with respect to the optical axis (11). The middle stage of multipole element (22) produces the field of the 3-fold symmetry within a plane perpendicular to the optical axis (11). The rear stage of multipole element (23) also produces the field of the 3-fold symmetry within the plane perpendicular to the optical axis (11). Any two stages of multipole elements are disposed in directions not to cancel out the 3-fold fields. However, the three stages of multipole elements are so disposed as to cancel out 3-fold astigmatisms.</p>
申请公布号 EP2020673(B1) 申请公布日期 2014.01.15
申请号 EP20080252352 申请日期 2008.07.10
申请人 JEOL LTD. 发明人 SAWADA, HIDETAKA
分类号 H01J37/153;H01J37/26 主分类号 H01J37/153
代理机构 代理人
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