发明名称 Process of making a polysilicon barrier layer in a self-aligned contact module
摘要 A method for forming a metal contact in a self aligned contact region over a impurity region in a substrate which comprises forming a doped polysilicon layer over the device surface except in a contact area. A thin polysilicon barrier layer and a metal layer, preferably tungsten, are then formed over the polysilicon layer and the contact area. The resulting metal contact has superior step coverage, lower resistivity, and maintains the shallow junction depth of buried impurity regions.
申请公布号 US5480814(A) 申请公布日期 1996.01.02
申请号 US19940365049 申请日期 1994.12.27
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD. 发明人 WUU, SHOU-GWO;LIANG, MONG-SONG;WANG, CHUAN-JUNG;SU, CHUNG-HUI
分类号 H01L21/60;(IPC1-7):H01L21/265;H01L21/70;H01L27/00;H01L21/44 主分类号 H01L21/60
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