发明名称 LAYERED SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD OF THE SAME
摘要 PROBLEM TO BE SOLVED: To allow an upper layer semiconductor device having a high-performance CMOS circuit to be layered on a base semiconductor device having a CMOS structure, and achieve high performance and low power consumption of a 3D-CMOS structure.SOLUTION: A layered semiconductor device comprises: a first complementary semiconductor device 100 in which a CMOS circuit and a wiring layer are formed on a semiconductor substrate 110; metal electrodes 141, 142 formed on the first complementary semiconductor device 100 together with the wiring layer; semiconductor layers 231, 232 which are formed on the metal electrodes 141, 142 via an insulation film 220 and isolated by an n-MOS region and a p-MOS region, respectively, and which are primarily composed of Ge; and a second complementary semiconductor device 200 constituted by forming an n-MOSFET on the semiconductor layer in the n-MOS region and forming a p-MOSFET on the semiconductor layer in the p-MOS region.
申请公布号 JP2014003184(A) 申请公布日期 2014.01.09
申请号 JP20120138103 申请日期 2012.06.19
申请人 NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL & TECHNOLOGY 发明人 IKEDA KEIJI;TEZUKA TSUTOMU;KAMIMUTA YUICHI;FURUSE KIYOE
分类号 H01L21/8238;H01L21/20;H01L21/768;H01L23/522;H01L27/00;H01L27/092;H01L29/41;H01L29/786 主分类号 H01L21/8238
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