发明名称 LITHOGRAPIC APPARATUS, SPECTRAL PURITY FILTER AND DEVICE MANUFACTURING METHOD
摘要 A lithographic apparatus for patterning a beam of radiation and projecting it onto a substrate, comprising at least two spectral purity filters configured to reduce the intensity of radiation in the beam of radiation in at least one undesirable range of radiation wavelength, wherein the two spectral purity filters are provided with different radiation filtering structures from each other.
申请公布号 EP2681625(A1) 申请公布日期 2014.01.08
申请号 EP20110802413 申请日期 2011.12.21
申请人 ASML NETHERLANDS BV 发明人 BANINE, VADIM;LOOPSTRA, ERIK;MOORS, ROEL;VAN SCHOOT, JAN;SWINKELS, GERARDUS;YAKUNIN, ANDREI;VAN DIJSSELDONK, ANTONIUS;DE BOEIJ, WILHELMUS
分类号 G03F7/20;G21K1/06 主分类号 G03F7/20
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