发明名称 |
SWITCHING ELEMENT AND MEMORY DEVICE EMPLOYING THE SAME |
摘要 |
<p>According to one embodiment of the present invention, for example, a switching element with excellent electrical properties and a switching property in about 400-450°C or more, and a memory device employing the same are provided. According to one side of the present invention, the switching element includes a first electrode; a second electrode; and a silicon-containing chalconitride layer formed between a first electrode and a second electrode. The silicon-containing chalconitride layer has excellent bidirectional switching performance for a long time in a very high temperature. [Reference numerals] (AA) Room temperature</p> |
申请公布号 |
KR20140001075(A) |
申请公布日期 |
2014.01.06 |
申请号 |
KR20120125035 |
申请日期 |
2012.11.06 |
申请人 |
SAMSUNG ELECTRONICS CO., LTD. |
发明人 |
LEE, DONG SOO;LEE, MYOUNG JAE;CHUNG, U IN |
分类号 |
H01L27/115;H01L21/8247 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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