发明名称 SWITCHING ELEMENT AND MEMORY DEVICE EMPLOYING THE SAME
摘要 <p>According to one embodiment of the present invention, for example, a switching element with excellent electrical properties and a switching property in about 400-450°C or more, and a memory device employing the same are provided. According to one side of the present invention, the switching element includes a first electrode; a second electrode; and a silicon-containing chalconitride layer formed between a first electrode and a second electrode. The silicon-containing chalconitride layer has excellent bidirectional switching performance for a long time in a very high temperature. [Reference numerals] (AA) Room temperature</p>
申请公布号 KR20140001075(A) 申请公布日期 2014.01.06
申请号 KR20120125035 申请日期 2012.11.06
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 LEE, DONG SOO;LEE, MYOUNG JAE;CHUNG, U IN
分类号 H01L27/115;H01L21/8247 主分类号 H01L27/115
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