发明名称 Integrated circuits and methods for forming the integrated circuits
摘要 A method for forming an integrated circuit includes forming a first dielectric layer over a gate electrode of a transistor. An etch-stop layer is formed over the first dielectric layer. An opening is formed through the first dielectric layer and the etch-stop layer, exposing a source/drain (S/D) region of the transistor. A metal layer is formed in the opening, contacting the S/D region of the transistor. The metal layer has a surface that is at least partially substantially level with a first top surface of the etch-stop layer. A damascene structure is formed and coupled with the metal layer.
申请公布号 US8617986(B2) 申请公布日期 2013.12.31
申请号 US20100841321 申请日期 2010.07.22
申请人 LIANG MING-CHUNG;CHEN CHII-PING;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 LIANG MING-CHUNG;CHEN CHII-PING
分类号 H01L21/44 主分类号 H01L21/44
代理机构 代理人
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