发明名称 Integrated circuit devices having selectively enabled scan paths with power saving circuitry
摘要 An integrated circuit device includes first and second latches (e.g, D-type flip flops) responsive to a clock signal. Each of the first and second latches respectively includes a data input terminal, a scan input terminal, a scan enable terminal and an output terminal. A combinational logic circuit may be provided, which is configured to receive the signal from the output terminal of the first latch and configured to generate a signal at the data input terminal of the second latch. A scan path is also provided, which is responsive to a scan enable signal. The scan path is configured to selectively pass a signal from the output terminal of the first latch to the scan input terminal of the second latch when the scan enable signal is active. A power saving switch is also provided. This switch, which is responsive to the scan enable signal, includes a first current carrying terminal electrically coupled to the scan path. The switch is configured to disable the scan path from passing the signal from the output terminal of the first latch to the scan input terminal of the second latch when the scan enable signal is in an inactive state.
申请公布号 US8621296(B2) 申请公布日期 2013.12.31
申请号 US201113165304 申请日期 2011.06.21
申请人 KWON SEOK-IL;LEE HOIJIN;SAMSUNG ELECTRONICS CO., LTD. 发明人 KWON SEOK-IL;LEE HOIJIN
分类号 G01R31/28 主分类号 G01R31/28
代理机构 代理人
主权项
地址