<p>The present invention relates to a method for manufacturing a nanoelectronic device, comprising: a step of sequentially forming a metal layer and a first oxide layer on a substrate with a semiconductor device and coating the substrate with a hardening resin; a step of performing an imprint process by pressing the resin-coated substrate with a stamp and exposing the substrate to UV; a step of separating the stamp from the resin after the imprint process; a step of dry etching the first oxide layer and the metal layer using the pattern on the resin as a hard mask; a step of removing the remaining resin and passivating the substrate with a second oxide layer after the dry etching process; and a step of flattening the second oxide layer using a CMP process and performing a dicing process.</p>
申请公布号
KR101345750(B1)
申请公布日期
2013.12.27
申请号
KR20130021002
申请日期
2013.02.27
申请人
APN CO., LTD.
发明人
NO, MAN GI;LEE, CHANG WOO;KIM, IL GYOO;KIM, DAE HWAN;LEE, YONG IL;LEE, CHOONG HO;SHIN, YO SEPH