发明名称 TESTING DEVICE FOR RESONANT COLUMN
摘要 The present invention relates to a testing device for a free-free resonant column which can continuously hit one point by installing an impact hammer on a bearing, thereby obtaining accurate resonant frequency data by minimizing errors which can occur while hitting, regardless of user skill. The testing device for a free-free resonant column according to the present invention comprises: a frame including a pair of horizontal shafts which are arranged in parallel, vertical shafts which are arranged in parallel and connect both ends of the horizontal shafts, and a secondary shaft which is connected to the horizontal shafts at both ends and is moveable; multiple detachable fastening parts which are detachably connected to the frame; holding bands which are made of flexible material, are connected to the detachable fastening parts at both ends, and holds a test specimen in a free-free condition; a hitting unit which is rotatable by being connected to the secondary shaft using a bearing and hits the test specimen; and a reception device which receives and analyzes a waveform generating by the test specimen.
申请公布号 KR20130141960(A) 申请公布日期 2013.12.27
申请号 KR20120065123 申请日期 2012.06.18
申请人 KNU-INDUSTRY COOPERATION FOUNDATION 发明人 CHOI, SUNG OONG;MIN, JUNE HYUN;LEE, SEUNG JOONG
分类号 G01N3/30;G01M7/08 主分类号 G01N3/30
代理机构 代理人
主权项
地址