| 摘要 |
PROBLEM TO BE SOLVED: To provide a metering device capable of improving the yield of a production line without any increase in fraction defective.SOLUTION: A metering device 1 includes an operation control part 17 which calculates statistics including an average value, a standard deviation, and a minimum value of a plurality of bodies W to be metered which are calculated by a calculation part 22, and the number of defectives on a lower-limit side of the bodies W to be metered whose metered value is less than a lower-limit value and the number of defectives on an upper-limit side of the bodies W to be metered whose metered value is larger than an upper-limit value, and calculates a correction quantity for a reference value such that the rate of defectives decreases upon the basis of the calculated statistics; and a display part 10 which displays the calculated correction quantity. |
