| 发明名称 |
SEMICONDUCTOR SUBSTRATE WITH ONBOARD TEST STRUCTURE |
| 摘要 |
Various interposers and methods of manufacturing related thereto are disclosed. In one aspect, a method of manufacturing is provided that includes fabricating a first test structure onboard an interposer that has a first side and second side opposite the first side. Additional test structures may be fabricated. |
| 申请公布号 |
US2013342231(A1) |
申请公布日期 |
2013.12.26 |
| 申请号 |
US201213529754 |
申请日期 |
2012.06.21 |
| 申请人 |
ALFANO MICHAEL;SIEGEL JOEL;SU MICHAEL Z.;BLACK BRYAN;MCLELLAN NEIL |
发明人 |
ALFANO MICHAEL;SIEGEL JOEL;SU MICHAEL Z.;BLACK BRYAN;MCLELLAN NEIL |
| 分类号 |
G01R1/04;G01R31/00;H05K3/30 |
主分类号 |
G01R1/04 |
| 代理机构 |
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代理人 |
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| 主权项 |
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| 地址 |
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