发明名称 Conductive line system and process
摘要 A system and method for providing a conductive line is provided. In an embodiment the conductive line is formed by forming two passivation layers, wherein each passivation layer is independently patterned. Once formed, a seed layer is deposited into the two passivation layers, and a conductive material is deposited to fill and overfill the patterns within the two passivation layers. A planarization process such as a chemical mechanical polish may then be utilized in order to remove excess conductive material and form the conductive lines within the two passivation layers.
申请公布号 US9368402(B2) 申请公布日期 2016.06.14
申请号 US201514833760 申请日期 2015.08.24
申请人 Taiwan Semiconductor Manufacturing Company, Ltd. 发明人 Huang Yu Yi;Kuo Hung-Jui;Liu Chung-Shi
分类号 H01L21/4763;H01L21/768;H01L23/31;H01L23/29;H01L23/00;H01L21/02;H01L21/027;H01L21/288;H01L23/532 主分类号 H01L21/4763
代理机构 Slater Matsil, LLP 代理人 Slater Matsil, LLP
主权项 1. A method of manufacturing a semiconductor device, the method comprising: placing a first photosensitive material over a conductive region over a substrate; patterning the first photosensitive material to remove unexposed first photosensitive material and expose the conductive region; placing a second photosensitive material over the first photosensitive material; patterning the second photosensitive material to remove exposed second photosensitive material and expose the conductive region, the patterning the second photosensitive material forming a patterned second photosensitive material and at least one opening in the patterned second photosensitive material, wherein the first photosensitive material extends from a first sidewall of the at least one opening to a second sidewall of the at least one opening; and forming a seed layer along sidewalls of the at least one opening.
地址 Hsin-Chu TW