发明名称 STRUCTURE AND METHOD FOR A COMPLIMENTARY RESISTIVE SWITCHING RANDOM ACCESS MEMORY FOR HIGH DENSITY APPLICATION
摘要 The present disclosure provides a resistive random access memory (RRAM) structure. The RRAM structure includes a bottom electrode on a substrate; a resistive material layer on the bottom electrode, the resistive material layer including a defect engineering film; and a top electrode on the resistive material layer.
申请公布号 US2013334486(A1) 申请公布日期 2013.12.19
申请号 US201213598378 申请日期 2012.08.29
申请人 TSAI CHUN-YANG;TING YU-WEI;HUANG KUO-CHING;TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY, LTD. 发明人 TSAI CHUN-YANG;TING YU-WEI;HUANG KUO-CHING
分类号 H01L45/00 主分类号 H01L45/00
代理机构 代理人
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