发明名称 APPARATUS AND METHOD FOR MEASURING PROFILE OF SURFACE OF CHARGING MATERIAL
摘要 PROBLEM TO BE SOLVED: To instantaneously perform planar or linear measurement of profiles of surfaces of various sorts of charging materials inserted into an installation such as a blast furnace and a storehouse, to achieve charging operation even during measurement, and to perform quick charging operation in accordance with measured profiles.SOLUTION: A profile measuring apparatus includes: a container with an airtight structure in which one or more transmission parts each for transmitting a detection medium and a plurality of receiving parts for receiving the detection medium are planarly or linearly arranged on one surface; transmission means connected to the transmission parts to control transmission of the detection medium; receiving means respectively connected to individual receiving parts to send each received signal to radar imaging processing means; and the radar imaging processing means connected to the receiving means. The container is airtightly attached to a single aperture formed in the vicinity of a top of the installation such that the transmission parts and the receiving parts are directed to charging materials. A detection medium transmitted from the transmission part and reflected by the charging material is received by the receiving part and the received signal is processed by the radar imaging processing means.
申请公布号 JP2013253883(A) 申请公布日期 2013.12.19
申请号 JP20120130070 申请日期 2012.06.07
申请人 WIRE DEVICE:KK 发明人 UEYASU TETSUSHI;KAYANO HAYAE
分类号 G01B21/20;G01B15/04;G01S7/02;G01S13/89 主分类号 G01B21/20
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