| 摘要 |
<p>The present invention relates to a method and to an apparatus for investigating the X-ray radiographic properties of samples (3c), wherein the X-rays scattered at a sample (3c) are recorded by a detector (5) located at a distance from the sample (3c) and evaluated with respect to the sample properties. According to the invention, provision is made, in the case of a prespecified distance between the X-ray source (1) or the point of origin (2b) of the X-ray (10) directed toward the sample (3c) and the detector (5), for a prespecified number of successive measurements, for the distance (S1, S2) between the sample (3c) and the detector (5) to be changed and set to prespecified different values.</p> |
