发明名称 SWITCHING-TYPE CATEGORIZING AND TESTING STRUCTURE OF RFIC
摘要 A switching-type categorizing and testing apparatus of a Radio Frequency integrated Circuit (RFIC) is used to test and categorize at least one RFIC module. The apparatus comprises at least one testing module and a plurality of categorizing modules. The testing module is used to test the RFIC module, and the categorizing modules comprise a first categorizing module and a second categorizing module. The testing module tests the RFIC module within one of the two categorizing modules at the same when the other categorizing module categorizes the RFIC module already tested. The present invention may further increase the testing and categorizing quantity so as to achieve the fast and cost-saving advantages.
申请公布号 US2013338959(A1) 申请公布日期 2013.12.19
申请号 US201213523895 申请日期 2012.06.15
申请人 HO YUN-PENG;CHEN LIANG-PO 发明人 HO YUN-PENG;CHEN LIANG-PO
分类号 G06F19/00 主分类号 G06F19/00
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