| 摘要 |
<p>A server (300) stores a plurality of configuration data (306). Tester hardware (100) is constructed so that at least some of the functionality thereof can be altered, in accordance with the configuration data (306) that is stored in a rewritable non-volatile memory (102); the tester hardware (100) is constructed so as to be capable of supplying power source voltage in respect of a DUT (4), transmitting signals to the DUT (4), and receiving signals from the DUT (4). (i) When a test system (2) is set up, an information processing device (200), in response to user input, acquires configuration data (306) from the server (300), and writes this data in the non-volatile memory (102). Also, (ii) when the DUT (4) is being tested, the information processing device (200) executes a test program that controls the tester hardware (100) and enables processing of data acquired by the tester hardware (100).</p> |
