发明名称 Method for manufacturing bonded wafer
摘要 A method for manufacturing a bonded wafer including bonding together a bond wafer and a base wafer each having a chamfered portion at an outer circumference and thinning the bond wafer, wherein the thinning of the bond wafer includes: a first step of performing surface grinding on the bond wafer such that a thickness of the bond wafer reaches a first predetermined thickness; a second step of removing an outer circumference portion of the ground bond wafer; and a third step of performing surface grinding on the bond wafer such that the thickness of the bond wafer reaches a second predetermined thickness.
申请公布号 US8603897(B2) 申请公布日期 2013.12.10
申请号 US201013519218 申请日期 2010.12.27
申请人 KATO TADAHIRO;SHIN-ETSU HANDOTAI CO., LTD. 发明人 KATO TADAHIRO
分类号 H01L21/30;H01L21/46 主分类号 H01L21/30
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